NDLI: Phase Formation and High-Temperature Stability of Very Thin Co-Sputtered Ti-Al and Multilayered Ti/Al Films on Thermally Oxidized Si Substrates

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Phase Formation and High-Temperature Stability of Very Thin Co-Sputtered Ti-Al and Multilayered Ti/Al Films on Thermally Oxidized Si Substrates

Content Provider	MDPI
Author	Seifert, Marietta Lattner, Eric Menzel, Siegfried B. Oswald, Steffen Gemming, Thomas
Copyright Year	2020
Description	Ti-Al thin films with a thickness of 200 nm were prepared either by co-sputtering from elemental Ti and Al targets or as Ti/Al multilayers with 10 and 20 nm individual layer thickness on thermally oxidized Si substrates. Some of the films were covered with a 20-nm-thick SiO $2$ layer, which was used as an oxidation protection against the ambient atmosphere. The films were annealed at up to 800 °C in high vacuum for 10 h, and the phase formation as well as the film architecture was analyzed by X-ray diffraction, cross section, and transmission electron microscopy, as well as Auger electron and X-ray photoelectron spectroscopy. The results reveal that the co-sputtered films remained amorphous after annealing at 600 °C independent on the presence of the SiO $2$ cover layer. In contrast to this, the $γ$ -TiAl phase was formed in the multilayer films at this temperature. After annealing at 800 °C, all films were degraded completely despite the presence of the cover layer. In addition, a strong chemical reaction between the Ti and SiO $2$ of the cover layer and the substrate took place, resulting in the formation of Ti silicide. In the multilayer samples, this reaction already started at 600 °C.
Starting Page	2039
e-ISSN	19961944
DOI	10.3390/ma13092039
Journal	Materials
Issue Number	9
Volume Number	13
Language	English
Publisher	MDPI
Publisher Date	2020-04-27
Access Restriction	Open
Subject Keyword	Materials Coatings and Films Tial Thin Films Surface Acoustic Waves High-temperature Stability Phase Formation
Content Type	Text
Resource Type	Article

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