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Optical Absorption in Si:H Thin Films: Revisiting the Role of the Refractive Index and the Absorption Coefficient
| Content Provider | MDPI |
|---|---|
| Author | Jarmila, Müllerová Pavol, Šutta Michaela, Holá |
| Copyright Year | 2021 |
| Description | This paper reports on absorption properties of thin films of hydrogenated amorphous and microcrystalline silicon considered for absorption-based applications, such as solar cell, photodetectors, filters, sensors, etc. A series of four amorphous and four microcrystalline samples PECVD deposited under varied hydrogen dilution was under consideration. Various absorption metrics, based separately on the absorption coefficient and the refractive index (single pass absorption, optical path length, classical light trapping limit) or direct absorptance calculated by the Yablonovitch concept based on a mutual role of them were examined and compared. Differences in absorption abilities are related to the evolving thin film microstructure. |
| Starting Page | 1081 |
| e-ISSN | 20796412 |
| DOI | 10.3390/coatings11091081 |
| Journal | Coatings |
| Issue Number | 9 |
| Volume Number | 11 |
| Language | English |
| Publisher | MDPI |
| Publisher Date | 2021-09-07 |
| Access Restriction | Open |
| Subject Keyword | Coatings Hydrogenated Silicon Amorphous Microcrystalline Thin Films Absorber Refractive Index Absorption Coefficient Optical Path Length Light Trapping Yablonovitch Absorptance |
| Content Type | Text |
| Resource Type | Article |
