NDLI: Multi-cycle broadside tests with runs of constant primary input vectors

Content Provider	IET Digital Library
Author	Pomeranz, Irith
Abstract	Multi-cycle tests, with two or more functional clock cycles between scan operations, can be used for test compaction. When tester limitations prevent primary input vectors from being changed at-speed, one of the possible solutions is to hold the primary input vector constant during the functional clock cycles of a multi-cycle test. However, this limits the level of test compaction that can be achieved. To provide an alternative to this solution, a new type of multi-cycle tests has been defined, where the primary input vector is changed during a clock cycle that is applied under a slow clock. This is followed by a run of the same vector applied under a fast clock. Transition faults are activated during the clock cycles that are applied under a fast clock. A test generation procedure that produces such test sets for transition faults has also been described. Experimental results demonstrate that the new type of tests can improve the ability to produce a compact test set for certain benchmark circuits.
Starting Page	90
Ending Page	96
Page Count	7
ISSN	17518601
Volume Number	8
e-ISSN	1751861X
Issue Number	Issue 2, Mar (2014)
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/iet-cdt/8/2
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/10.1049/iet-cdt.2013.0101
Journal	IET Computers & Digital Techniques
Publisher Date	2013-12-03
Access Restriction	Open
Rights Holder	© The Institution of Engineering and Technology
Subject Keyword	Benchmark Circuit Circuit For Digital Computers Circuit Testing Clock Cycle Clocks Constant Primary Input Vector Digital Circuit Digital Circuit Design, Modelling And Testing Fast Clock Functional Clock Cycles Multicycle Broadside Tests Slow Clock Test Compaction Test Generation Procedure Transition Fault
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Hardware and Architecture Software

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