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| Content Provider | IET Digital Library |
|---|---|
| Author | Zhang, Chen Duan, Zhenhua Yu, Bin Tian, Cong Ding, Ming |
| Abstract | To improve the test automation in software development process, following the researches on test cases generation technology from models, an incremental test case generation approach is proposed based on finite automata, and Event deterministic finite automata (ETDFA) are employed to describe the sequence diagram models of system interaction. By model checked with Propositional projection temporal logic (PPTL), the correctness of ETDFA is verified. Then we can get the composed automata by synthesis rules, and generate the test cases incrementally by test cases generation algorithm. Case studies are presented to show that this approach enables to improve test cases correctness, and reduce the complexity of test cases generation process. |
| Starting Page | 234 |
| Ending Page | 240 |
| Page Count | 7 |
| ISSN | 10224653 |
| Volume Number | 25 |
| e-ISSN | 20755597 |
| Issue Number | Issue 2, Mar (2016) |
| Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/cje/25/2 |
| Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/10.1049/cje.2016.03.007 |
| Journal | Chinese Journal of Electronics |
| Publisher Date | 2016-03-01 |
| Access Restriction | Open |
| Rights Holder | © Chinese Institute of Electronics |
| Subject Keyword | Automata Model Automata Theory Deterministic Automata Diagnostic, Testing, Debugging And Evaluating System ETDFA Event Deterministic Finite Automata Finite Automata Formal Logic Formal Method Incremental Test Case Generation Approach Model Checking PPTL Program Testing Program Verification Propositional Projection Temporal Logic Sequence Diagram Software Development Process Synthesis Rules System Interaction Sequence Diagram Model Temporal Logic Test Automation Test Cases Correctness Test Cases Generation Process Complexity Reduction Test Cases Generation Technology |
| Content Type | Text |
| Resource Type | Article |
| Subject | Applied Mathematics Electrical and Electronic Engineering |
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