NDLI: Fault Samples Acquisition and Fault Feature Verification of Analog Filters

Content Provider	IET Digital Library
Author	Huang, Liang Liao, Yuan
Abstract	The frequency of the input signal is selected specially to ensure that the input frequency just exceeds the cut-off frequency of analog filters. Because input signal is restrained partly by the attenuation of analog filters, output signal is sensitive to the variation of fault components. The peak voltage of key points is measured to construct fault samples of analog filters. The relationship between fault components and fault samples is analyzed to verify that fault samples have strong fault information of analog filters. The experimental results show that high-quality fault samples can be acquired efficiently, and fault feature of samples can be verified objectively by the present method.
Starting Page	122
Ending Page	127
Page Count	6
ISSN	10224653
Volume Number	26
e-ISSN	20755597
Issue Number	Issue 1, Jan (2017)
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/cje/26/1
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/10.1049/cje.2016.06.015
Journal	Chinese Journal of Electronics
Publisher Date	2017-01-01
Access Restriction	Open
Rights Holder	© Chinese Institute of Electronics
Subject Keyword	Analog Filter Analogue Circuit Analogue Circuit Design Cut-off Frequency Fault Component Fault Diagnosis Fault Feature Verification Fault Sample Acquisition Filter Filter And Other Network Modelling Testing
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Analogue circuit fault diagnosis based on convolution neural network

Bandpass filters with multiple transmission zeros using open/shorted stubs

Experiment on fault location in large-scale analog circuits

Automated selection of test frequencies for fault diagnosis in analog electronic circuits

0.9 V third-order 132 MHz single-OPAMP analogue filter in 28 nm CMOS

Analog fault diagnosis of actual circuits using neural networks

Subband filtering for time and frequency analysis of mixed-signal circuit testing

A new adaptive analog test and diagnosis system

Filtering Doherty power amplifier

Fault Samples Acquisition and Fault Feature Verification of Analog Filters

Similar Documents

Analogue circuit fault diagnosis based on convolution neural network

Bandpass filters with multiple transmission zeros using open/shorted stubs

Experiment on fault location in large-scale analog circuits

Automated selection of test frequencies for fault diagnosis in analog electronic circuits

0.9 V third-order 132 MHz single-OPAMP analogue filter in 28 nm CMOS

Analog fault diagnosis of actual circuits using neural networks

Subband filtering for time and frequency analysis of mixed-signal circuit testing

A new adaptive analog test and diagnosis system

Filtering Doherty power amplifier

Fault Samples Acquisition and Fault Feature Verification of Analog Filters