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| Content Provider | IET Digital Library |
|---|---|
| Author | Huang, Hongyi Hu, Yue Xue, Feng |
| Abstract | The partial discharge (PD) in a void of epoxy solid insulation is a typical kind of PD behaviour, its occurrences may lead to complete breakdown of the insulation system. The microscopic process of particle movement is simulated here by using particle in cell-Monte–Carlo collision (PIC-MCC) method, which possesses great significance for researching typical discharge. The simulation results of void discharge and point discharge show detailed motion process and the Townsend discharge phenomenon. The PD current pulse waveform possesses similar trends of steep rising edge and gentle falling edge compared with Gaussian function. The behaviour of discharge events is influenced by many factors, such as electric field strength, void thickness, and polarity effect. Thus, the characteristics of PD are discussed and compared by adjusting these simulation parameters to find out internal connection and performance differences. |
| Starting Page | 447 |
| Ending Page | 452 |
| Page Count | 6 |
| ISSN | 17518822 |
| Volume Number | 13 |
| e-ISSN | 17518830 |
| Issue Number | Issue 3, May (2019) |
| Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/iet-smt/13/3 |
| Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/10.1049/iet-smt.2018.5148 |
| Journal | IET Science, Measurement & Technology |
| Publisher Date | 2018-12-11 |
| Access Restriction | Open |
| Rights Holder | © The Institution of Engineering and Technology |
| Subject Keyword | Current Pulse Characteristic Analysis Dielectric Breakdown And Discharges Discharge Events Epoxy Solid Insulation Insulation System Monte Carlo Method Partial Discharge Measurement Partial Discharges Particle in Cell-Monte-Carlo Collision Method PD Behaviour PIC-MCC Method Point Partial Discharge Townsend Discharge Townsend Discharge Phenomenon Void Discharge Void Thickness Voids (solid) |
| Content Type | Text |
| Resource Type | Article |
| Subject | Atomic and Molecular Physics, and Optics Electrical and Electronic Engineering |
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