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Content Provider | IET Digital Library |
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Author | Saheba, Suketu M. Upadhyaya, Trushit K. Sharma, Ritesh Kumar |
Abstract | The probability of precise soft landing on the lunar surface could be significantly increased by using craters as a navigational landmark. This article aims at the edge information of crater for lander navigation. First, histogram of an image is calculated and adaptive Gaussian filter is applied. Then adaptive canny algorithm is applied to detect edges of craters at different illumination. The craters are extracted by the mechanism of paring the selected valid edges followed by pattern fitting. These detected craters are used as navigational landmarks and for velocity estimation of the lander. Experimental results show the adaptive ability of algorithms for crater detection at different illuminations and different terrains. Craters at high illuminations are also efficiently detected. These detected craters are matched with the reference crater database by use of pattern matching algorithm for horizontal velocity calculations. |
Starting Page | 657 |
Ending Page | 661 |
Page Count | 5 |
ISSN | 17519659 |
Volume Number | 10 |
e-ISSN | 17519667 |
Issue Number | Issue 9, Sep (2016) |
Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/iet-ipr/10/9 |
Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/10.1049/iet-ipr.2015.0232 |
Journal | IET Image Processing |
Publisher Date | 2016-09-01 |
Access Restriction | Open |
Rights Holder | © The Institution of Engineering and Technology |
Subject Keyword | Adaptive Canny Algorithm Adaptive Edge Detection Algorithm Adaptive Gaussian Filter Edge Detection Entry, Descent And Landing (Spacecraft) Horizontal Velocity Calculations Illumination Lander Navigation Lunar Interior, Surface, And Atmosphere Lunar Surface Lunar Surface Crater Topology Generation Lunar, Planetary, And Deep-Space Probes Navigational Landmark Pattern Fitting Precise Soft Landing |
Content Type | Text |
Resource Type | Article |
Subject | Signal Processing Electrical and Electronic Engineering Computer Vision and Pattern Recognition Software |
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