NDLI: Test and analysis on sensitivity of low-voltage releases to voltage sags

Content Provider	IET Digital Library
Author	Ouyang, Sen Liu, Ping Liu, Liyuan Li, Xiang
Abstract	This study discusses the sensitivity (i.e. ride-through performance) of low-voltage releases to voltage sags on the basis of extensive tests, and presents two sensitivity models to assess the tripping characteristics of low-voltage releases, which have not been studied before. First, working principle of low-voltage release and existing standards are reviewed. Second, a detailed test scheme is proposed and ten kinds of low-voltage releases have been tested. Test results show that magnitude, duration and point-on-wave angle of voltage sag jointly determine the sensitivity of low-voltage releases. After extremely processing test results and applying the curve fitting theory, the functions representing the relationship between magnitude and duration at different point-on-wave angles are formed, which symbolise a detailed sensitivity model of low-voltage release. Moreover, the other simpler and more practical sensitivity model is proposed by introducing rectangular envelope lines of voltage tolerance curves at different point-on-wave angle.
Starting Page	2664
Ending Page	2671
Page Count	8
ISSN	17518687
Volume Number	9
e-ISSN	17518695
Issue Number	Issue 16, Dec (2015)
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/iet-gtd/9/16
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/10.1049/iet-gtd.2015.0547
Journal	IET Generation, Transmission & Distribution
Publisher Date	2015-12-03
Access Restriction	Open
Rights Holder	© The Institution of Engineering and Technology
Subject Keyword	Curve Fitting Curve Fitting Theory Harmonics Interpolation And Function Approximation Low-voltage Releases Numerical Analysis Power Supply Quality Rectangular Envelope Line Sensitivity Analysis Sensitivity Model Test Scheme Tripping Characteristic Voltage Sag Duration Voltage Sag Magnitude Voltage Sag Point-on-wave Angle Voltage Tolerance Curves
Content Type	Text
Resource Type	Article
Subject	Control and Systems Engineering Energy Engineering and Power Technology Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Test and study on sensitivity of electronic circuit in low-voltage release to voltage sags

Analytical model of AC contactors for studying response mechanism to multi-dimensional voltage sag characteristics and its novel applications

Voltage sag/swell waveform analysis method based on multi-dimension characterisation

A New Approach for Modeling Voltage–Current Characteristics of Fluorescent Lamps

Practical test method for the sensitivity of programmable logic controller to voltage sags and short interruptions

Reactive current injection protocol for low-power rating distributed generation sources under voltage sags

Voltage sag susceptibility of 230 V equipment

Identification of Weak Areas of Network Based on Exposure to Voltage Sags—Part II: Assessment of Network Performance Using Sag Severity Index

Voltage Sag Acceptability Assessment Using Multiple Magnitude-Duration Function

Test and analysis on sensitivity of low-voltage releases to voltage sags

Similar Documents

Test and study on sensitivity of electronic circuit in low-voltage release to voltage sags

Analytical model of AC contactors for studying response mechanism to multi-dimensional voltage sag characteristics and its novel applications

Voltage sag/swell waveform analysis method based on multi-dimension characterisation

A New Approach for Modeling Voltage–Current Characteristics of Fluorescent Lamps

Practical test method for the sensitivity of programmable logic controller to voltage sags and short interruptions

Reactive current injection protocol for low-power rating distributed generation sources under voltage sags

Voltage sag susceptibility of 230 V equipment

Identification of Weak Areas of Network Based on Exposure to Voltage Sags—Part II: Assessment of Network Performance Using Sag Severity Index

Voltage Sag Acceptability Assessment Using Multiple Magnitude-Duration Function

Test and analysis on sensitivity of low-voltage releases to voltage sags