NDLI: Reference-invariant permittivity and thickness measurement of lossy liquid materials

Content Provider	IET Digital Library
Author	Hasar, U. C. Bute, M.
Abstract	A microwave method has been proposed to retrieve the complex permittivity and thickness of lossy dielectric liquids, which result in at least 10 dB attenuation, using reference-plane-invariant reflection scattering (S-) parameters. The CST Microwave Studio simulation program was first used to validate the method. Then, the permittivity and thickness of lossy distilled water sample poured over a polyethylene sample holder were measured from reference-invariant reflection-only S-parameter measurements at the X-band. The method was compared with other methods in the literature to analyse its accuracy.
Starting Page	544
Ending Page	546
Page Count	3
ISSN	00135194
Volume Number	53
e-ISSN	1350911X
Issue Number	Issue 8, Apr (2017)
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/el/53/8
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/10.1049/el.2016.3793
Journal	Electronics Letters
Publisher Date	2017-03-17
Access Restriction	Open
Rights Holder	© The Institution of Engineering and Technology
Subject Keyword	CST Microwave Studio Simulation Program Dielectric Liquids Dielectric Material And Property Dielectric Permittivity Dielectric Variables Measurement Electrical Instruments And Technique Lossy Dielectric Liquids Lossy Distilled Water Lossy Liquid Material Microwave Measurement Technique Microwave Method Permittivity Measurement Photonic Technology Polyethylene Sample Holder Reference-invariant Permittivity Reference-plane-invariant Reflection Scattering Parameter S Parameter Spatial Variables Measurement Thickness Measurement
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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