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| Content Provider | IET Digital Library |
|---|---|
| Author | Zhang, E. J. Tombez, L. Teng, C. C. Wysocki, G. Green, W. M. J. |
| Abstract | The authors present an adaptive algorithm based on a non-linear regression model for mitigating time-varying etalon drifts in line-scanned optical absorption spectrometers. By dynamically varying the etalon spectral background using physically realistic degrees of freedom, the authors’ dynamic etalon fitting-routine (DEF-R) significantly increases the spectral baseline recalibration interval as compared to conventional fringe subtraction models. They provide an empirical demonstration of the efficacy of DEF-R using an on-chip 10 cm silicon waveguide for near-infrared methane absorption spectroscopy at 6057 cm−1, which suffers significant etalon spectral noise due to reflections and multi-path interference from stochastic line-edge roughness imperfections. They demonstrate the corresponding improvement in both spectral clean-up and long-term stability via Allan-variance analysis. For the sensor presented here, application of DEF-R enables Gaussian-noise limited performance for more than 102 s and provides almost an order-of-magnitude improvement in stability time with respect to conventional baseline subtraction. Although DEF-R is applied here to an on-chip sensor embodiment, they envision their technique to be applicable to any absorption sensor limited by time-varying etalon drifts. |
| Starting Page | 851 |
| Ending Page | 853 |
| Page Count | 3 |
| ISSN | 00135194 |
| Volume Number | 55 |
| e-ISSN | 1350911X |
| Issue Number | Issue 15, Jul (2019) |
| Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/el/55/15 |
| Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/10.1049/el.2019.0901 |
| Journal | Electronics Letters |
| Publisher Date | 2019-06-11 |
| Access Restriction | Open |
| Rights Holder | © The Institution of Engineering and Technology |
| Subject Keyword | Absorption Sensor Adaptive Etalon Suppression Technique Adaptive Optics Allan-variance Analysis Bolometers Chemical Sensor Couplers Detection of Radiation Dynamic Etalon Fitting-routine Edge And Boundary Effects; Optical Reflection And Refraction Elemental Semiconductor Etalon Spectral Background Fringe Subtraction Model Gaussian-noise Limited Performance High Index Contrast Waveguide-based Laser Absorption Spectrometers Infrared Detector Infrared Spectra Laser Noise Light Interference Light Interferometry Light Reflection Light Reflections Line-scanned Optical Absorption Spectrometers Long-term Stability Improvement Measurement by Laser Beam Metrological Application of Lasers Near-infrared Methane Absorption Spectroscopy Nonlinear Regression Model On-chip Sensor Embodiment On-chip Silicon Waveguide Optical Interference And Speckle Optical Interferometry Optical Sonsor Optical Waveguide Organic Compound PhotoDetector Photoelectric Cell Regression Analysis Silicon Size 10.0 Cm Spectral Baseline Recalibration Interval Statistical Analysis Stochastic Line-edge Roughness Imperfections Submillimetre Wave Detection Time-varying Etalon Drifts |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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