NDLI: Time lag in CM-II electrode system attributed to dielectric surface conditioning

Content Provider	IEEE Xplore Digital Library
Author	Nawawi, Z. Ahmad, H. Kurnianto, R. Hozumi, N. Nagao, M.
Copyright Year	2012
Description	Author affiliation: Dept.of Electr. & Electron. Engg., Toyohashi University of Tech., Toyohashi, Japan (Hozumi, N.; Nagao, M.) \|\| Faculty of Engineering, Universiti Teknologi Malaysia, Johor Bahru, Malaysia (Ahmad, H.) \|\| Dept. of Electrical Engineering, Tanjungpura University, Pontianak, Indonesia (Kurnianto, R.) \|\| Dept. of Electrical Engineering, Sriwijaya University, Palembang, Indonesia (Nawawi, Z.)
Abstract	This paper deals with a digest on discharge time lag characteristics in a cylindrical void bounded polymethyl-methacrylate (PMMA) and metal using the CIGRE method II (CM-II) electrode system. The specimens were treated by plasma irradiations (0, 3, 6, 11, 16, 21 seconds) simulating material ageing in service which are very difficult to measure. It was found that, under room temperature, the longer plasma irradiation to the void surface will result in higher degree of surface roughness indicated by the increase of surface protrusion sizes. The statistical discharge time lag (SDTL) has been studied using square pulse voltage with rising time 40 μs, through 64 pulses. The SDTL value is inversely proportional to the surface conditioning. For a particular time period of plasma irradiation (3 s), the specimens seem to recover its insulating property after given recovery time of 20, 60, and 180 minutes compared to that of without recovery time.
Starting Page	425
Ending Page	428
File Size	1683296
Page Count	4
File Format	PDF
ISBN	9781467310192
e-ISBN	9781467310208
DOI	10.1109/CMD.2012.6416169
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-09-23
Publisher Place	Indonesia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Decision support systems Condition monitoring square pulse voltage CM-II electrode system Conferences PMMA recovery times plasma irradiation SDTL
Content Type	Text
Resource Type	Article

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