NDLI: Dependable digitally-assisted mixed-signal IPs based on integrated self-test & self-calibration

Content Provider	IEEE Xplore Digital Library
Author	Kerkhoff, H.G. Jinbo Wan
Copyright Year	2010
Description	Author affiliation: Testable Design and Test of Integrated Systems (TDT) Group, University of Twente, Centre of Telecommunication and Information Technology (CTIT), Enschede, the Netherlands (Kerkhoff, H.G.; Jinbo Wan)
Abstract	Heterogeneous SoC devices, including sensors, analogue and mixed-signal front-end circuits and the availability of massive digital processing capability, are being increasingly used in safety-critical applications like in the automotive, medical, and the security arena. Already a significant amount of attention has been paid in literature with respect to the dependability of the digital parts in heterogeneous SoCs. This is in contrast to especially the sensors and front-end mixed-signal electronics; these are however particular sensitive to external influences over time and hence determining their dependability. This paper provides an integrated SoC / IP approach to enhance the dependability. It will give an example of a digitally-assisted mixed-signal front-end IP which is being evaluated under its mission profile of an automotive tyre pressure monitoring system. It will be shown how internal monitoring and digitally-controlled adaptation by using embedded processors can help in terms of improving the dependability of this mixed-signal part under harsh conditions for a long time.
Starting Page	1
Ending Page	6
File Size	1008927
Page Count	6
File Format	PDF
ISBN	9781424477920
e-ISBN	9781424477937
e-ISBN	9781424477913
DOI	10.1109/IMS3TW.2010.5503008
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-06-07
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Availability System testing mixedsignal testing dependability reliability self-test self-calibration Built-in self-test availability Circuit testing Automotive engineering Automatic testing safety Aging Medical tests Tires Safety aging self-repair
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life

A Built-in self-calibration scheme for pipelined ADCs

A self-testing assisted pipelined-ADC calibration technique

Built-in self-test approaches for analogue and mixed-signal integrated circuits

A mixed-signal built-in self-test approach for analog circuits

Development of automatic diagnostic test system for mixed-signal/analog integrated circuits

Digitally-Assisted Analog/RF Testing for Mixed-Signal SoCs

A Dependability Solution for Homogeneous MPSoCs

A novel mixed-signal self-calibration technique for baseband filters in systems-on-chip mobile transceivers

Dependable digitally-assisted mixed-signal IPs based on integrated self-test & self-calibration

Similar Documents

SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life

A Built-in self-calibration scheme for pipelined ADCs

A self-testing assisted pipelined-ADC calibration technique

Built-in self-test approaches for analogue and mixed-signal integrated circuits

A mixed-signal built-in self-test approach for analog circuits

Development of automatic diagnostic test system for mixed-signal/analog integrated circuits

Digitally-Assisted Analog/RF Testing for Mixed-Signal SoCs

A Dependability Solution for Homogeneous MPSoCs

A novel mixed-signal self-calibration technique for baseband filters in systems-on-chip mobile transceivers

Dependable digitally-assisted mixed-signal IPs based on integrated self-test & self-calibration