NDLI: On-wafer large signal power, S-parameter and waveform measurement system

Content Provider	IEEE Xplore Digital Library
Author	Demmler, M. Tasker, P.J. Schlechtweg, M.
Copyright Year	1994
Description	Author affiliation: Fraunhofer-Inst. fur Angewandte Festkorperphys., Freiburg, Germany (Demmler, M.; Tasker, P.J.; Schlechtweg, M.)
Abstract	An on-wafer measurement system has been developed for the complete characterization of the large signal behavior of transistors up to 40 GHz based on the microwave transition analyzer HP 71500A. The vector measurement capability of the MTA is utilized to allow full vector calibration of the measurement system for the fundamental and the higher harmonics. The error corrected waveforms at the transistor terminals are derived from the measurement data. Novel analysis concepts have been developed for the extraction of transistor characteristics and parameters from large signal RF measurements, i.e., RF current and voltage constraints associated with the output characteristic and the RF large signal transfer characteristic. These parameters, measured under real RF operating conditions, can be compared directly with DC or small signal S-parameter measurements. This is essential if large signal RF measurements are used for the optimization of high power transistor structures and in the development of accurate non-linear CAD models.
Starting Page	153
Ending Page	158
File Size	490023
Page Count	6
File Format	PDF
ISBN	0780324099
ISSN	09388028
DOI	10.1109/INMMC.1994.512522
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1994-10-05
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Radio frequency Power measurement Data analysis RF signals Scattering parameters Microwave transistors Calibration Error correction Signal analysis Microwave measurements
Content Type	Text
Resource Type	Article

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