NDLI: Scanning micro-interferometer array with sub-picometer resolution for MEMS inspection

Content Provider	IEEE Xplore Digital Library
Author	Karhade, O.G. Degertekin, L. Kurfess, T.R.
Copyright Year	2008
Description	Author affiliation: Georgia Inst. of Technol., Atlanta (Karhade, O.G.; Degertekin, L.)
Abstract	Micro scanning grating interferometer (muSGI) is a micromachined optical sensor to inspect MEMS. This paper presents the design, fabrication, implementation and analysis of an array of such muSGIs. The muSGIs are capable of static and dynamic displacement measurements. The muSGIs have phase sensitive micromachined gratings which are actuated by electrostatic force. The muSGIs are fabricated on SOI wafers. The fabricated tunable gratings exhibit the first resonance mode at 48 kHz and a damping ratio of ~0.05. The gratings show sufficient (~400 nm) displacement range for tuning it to high sensitivity position, achieved with 30 V operating voltage range. To actively tune the gratings a novel control algorithm is implemented real-time in a field-programmable gate array (FPGA). It adjusts the position of each grating with respect to corresponding sample, to achieve high sensitivity. Active control scheme is modeled using MATLAB and the performance results show good agreement with the experiments. The control algorithm is successfully used to characterize the tunable gratings and to demonstrate parallel operation of the muSGIs. Experimental results demonstrate a vertical resolution of 0.2 pm over 1 Hz bandwidth.
Starting Page	113
Ending Page	118
File Size	1116761
Page Count	6
File Format	PDF
ISBN	9781424419623
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-02-12
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Optical interferometry MEMS metrology Inspection Force sensors Micromechanical devices sub-picometer resolution Optical device fabrication Displacement measurement Interferometer array Gratings Optical sensors Electrostatics Field programmable gate arrays
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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