NDLI: Degradation data-based quantitative qualification for high reliable microelectronic device

Content Provider	IEEE Xplore Digital Library
Author	Bo Sun Jiuzheng Cui Qiang Feng
Copyright Year	2011
Description	Author affiliation: School of Reliability and Systems Engineering, BEIHANG University, Beijing China (Bo Sun; Jiuzheng Cui; Qiang Feng)
Abstract	The quality (or reliability) cannot be qualified for high reliable microelectronic devices (failure rate less than $10^{−6}/h)$ through qualification and quality conformance procedures in military standard. A method of quantitative qualification is proposed based on the distribution of degraded tests parameters for Destructive Physical Analysis (DPA). Firstly, based on the 5005.2 method (qualification and quality conformance procedures) in GJB 548B, a new inspection program is proposed for high reliable microelectronic devices. Then, the basic theory, general process, and mathematical model for quantitative qualification are presented. Finally, a quantitative value of failure rate or reliability for microelectronic devices can be drawn according to the new inspection program and qualification method. The case study conducted on programmable timer samples shows that the failure rate or reliability of high reliable microelectronics can be qualified quantitatively.
Starting Page	159
Ending Page	164
File Size	334435
Page Count	6
File Format	PDF
ISBN	9781612846675
e-ISBN	9781612846668
DOI	10.1109/ICRMS.2011.5979254
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-06-12
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Degradation microelectronic device Force high reliability degradation data Inspection quantitative qualification Microelectronics Reliability Weibull distribution Qualifications
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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