NDLI: System Fault Behavior Model Considering the Effects of Structural Factors and Method of Its Description

Content Provider	IEEE Xplore Digital Library
Author	Zhao Guangyan Kang Rui Sun Yufeng Zhao Gang
Copyright Year	2010
Abstract	System dependability research is gradually making the transit of focusing on “fault time” to focusing on “fault process”. The researches on dependability models of micro failure mechanism and macro fault behavior have become hot topics. The system fault behavior model describes the occurrence and development process of system fault in term of the behavior, and also presents the effect of basic unit failure on the whole system. The factors influencing the system fault behavior include the intrinsic factors such as material, structure, etc. and the extrinsic factors such as usage mode, environment, human factors, etc. The interactions between different types of factors lead to the complexity of the fault behavior models. On the basis of the frame of fault behavior model, this paper builds the system fault behavior model considering the effects of structural factors in term of the intrinsic factors. This paper adopts extended Petri Nets models to describe such model so that realize simulating the fault process. This method builds dependability model from a new angle, pays attention to process depicting, and describes the rules of the occurrence and development of system fault, which is a strong complement to the existing dependability theory. Under the condition, this paper puts forward the fault behavior model based on structure and its description method, which offers a kind of feasible technique to the frame of the fault behavior theory.
Starting Page	118
Ending Page	124
File Size	270655
Page Count	7
File Format	PDF
ISBN	9781424475308
e-ISBN	9781424475315
DOI	10.1109/DEPEND.2010.26
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-07-18
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Solid modeling Analytical models fault behavior Object oriented modeling Computational modeling dependability Petri Nets Color model Circuit faults Integrated circuit modeling structure
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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