NDLI: Fault feature exaction method for the circuit based on Haar wavelet filter banks

Content Provider	IEEE Xplore Digital Library
Author	Meng Xianguo Li Jimin Feng Bing Yang Zhen
Copyright Year	2011
Description	Author affiliation: Army 63726, Yinchuan 750000, China (Yang Zhen) \|\| Baicheng Ordnance Test Center of China, 137001, China (Li Jimin) \|\| Ordnance Engineering College, Shijiazhuang 050003, China (Meng Xianguo; Feng Bing)
Abstract	According to features of analog circuit test response with pseudo random stimulus signal, fault feature exaction method for the circuit based on wavelet filter banks is presented in the paper. The frequency spectral of the test response signal is decomposed into some parts equably or unequally by Haar wavelet filter banks. Comparing each sub-band signal of response of the different circuit faults, we can find the sub-band with the maximal difference among different fault responses. The fault feature exaction is achieved by the maximal difference sub-band. Because the test response is addressed in different band, fault character exaction method based on wavelet filter group has high precision and high resolving power for parametric fault.
Starting Page	118
Ending Page	122
File Size	122635
Page Count	5
File Format	PDF
ISBN	9781424481583
e-ISBN	9781424481613
DOI	10.1109/ICEMI.2011.6037960
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-08-16
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault diagnosis Instruments fault feature exaction Filter banks Analog circuits wavelet filter banks Wavelet analysis Wavelet packets analog circuit Circuit faults
Content Type	Text
Resource Type	Article

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