NDLI: Calibrated time-domain nearfield-immunity test on printed-circuit board level

Content Provider	IEEE Xplore Digital Library
Author	Krause, M. Leone, M.
Copyright Year	2013
Description	Author affiliation: Otto-von-Guericke-Univ. Magdeburg, Magdeburg, Germany (Krause, M.; Leone, M.)
Abstract	Field-immunity scanning with small field probes closely above printed-circuit boards allows localizing sensitive circuit areas with high resolution. For quantifying the sensitivity level and to assure repeatable results a suitable calibration method is presented. In contrast to recent approaches based on the forward power supplied to the probe, this paper presents an accurate method using a mini-TEM cell, which allows adjusting the desired field strength at a selected distance. As an extension to previous work restricted to CW signals, in this paper it is shown how the calibration can be performed for arbitrary transient noise signals. Validation is carried out by an exact field-simulation of the near-field coupling into a signal trace. As an application example the Bit Error Ratio (BER) of a simple digital data transmission subject to a trapezoidal noise signal is investigated, depending on repetition rate, probe position and field strength.
Starting Page	693
Ending Page	698
File Size	2631531
Page Count	6
File Format	PDF
ISBN	9781467349802
ISSN	23250364
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-09-02
Publisher Place	Belgium
Access Restriction	Subscribed
Rights Holder	EMC Europe Foundation
Subject Keyword	Magnetic field measurement Voltage measurement Bit error rate Probe calibration Transmission line measurements Bit Error Rate Calibration Impedance Nearfield-Immunity Scan Probes Time Domain Analysis
Content Type	Text
Resource Type	Article

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