NDLI: Influence of porosity on properties in fluorocarbon piezoelectrets

Content Provider	IEEE Xplore Digital Library
Author	Ke-xing Lou Xiao-qing Zhang Gong-xun Cao Zhuan-lan Sun Zhong-fu Xia
Copyright Year	2010
Description	Author affiliation: Shanghai Key Laboratory of Special Artificial Microstructure Material and Technology, Department of Physics, Tongji University 20092, China (Ke-xing Lou; Xiao-qing Zhang; Gong-xun Cao; Zhuan-lan Sun; Zhong-fu Xia)
Abstract	The ifluorocarbon polymer films with regular void structure, made from fluoroethylenepropylene (FEP) and porous polytetrafluoroethylene (PTFE) layers were prepared by using the template patterning and fusion bonding process. After proper corona or contact charging, the films were piezoelectric. The microstructure, mechanical property, piezoelectricity and viscoelasticity of the fabricated films were studied by means of scanning electron microscope (SEM) technique, measurements of dielectric resonance spectra, and analysis of quasi-static d33 coefficient in time domain. The results show that, there ate threshold values of polarization about −4000 V, −3000 V and −2000 V in the films with porosities of 0,25% and 44%, respectively, and above the threshold voltage, the piezoelectric coefficient d33 of the films increases significantly with the enhancement of the polarization voltage. For the films with porosities of 0,25% and 44%, the measured dielectric anti-resonance frequencies are around 104 kHz, 119 kHz and 132 kHz, the calculated Young's modulus are about 0.9 MPa, 0.58 MPa and 0.53 MPa and the densities of surface charge are 0.009 $µC/cm^{2},$ 0.029 $µC/cm^{2}$ and 0.046 $µC/cm^{2},$ respectively. The piezoelectric response in time domain reflects the viscoelastic behaviors in the films. In addition, the films with large porosity show an improved piezoelectricity, which is perhaps due to the relative high density of charge and low Young's modulus in. them.
Starting Page	89
Ending Page	94
File Size	8077971
Page Count	6
File Format	PDF
ISBN	9781424498222
e-ISBN	9781424498215
DOI	10.1109/SPAWDA.2010.5744281
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-12-10
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	regular structure piezoelectricity Piezoelectret Films porosity
Content Type	Text
Resource Type	Article

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