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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Zheng Wei Yang Wei Zhang Gan Tian Yuan Jia Song Ren Bing Li Yan Wang Dong Dong Wang |
| Copyright Year | 2010 |
| Description | Author affiliation: 203 office, Xi'an Research Inst. of Hi-Tech, Hong-qing Town, Xi'an, China, 710025 (Zheng Wei Yang; Wei Zhang; Gan Tian; Yuan Jia Song; Ren Bing Li; Yan Wang; Dong Dong Wang) |
| Abstract | An adhesive structure specimen, fabricated with several back-drilled flat holes of different size to simulate debond defects, was inspected by infrared thermography. Three larger defects could be seen directly by the raw images. However, two smaller defects could not be detected by the raw images because of high noise. The noise contributed by the variation of surface emissivity, was eliminated to some extent by coating the testing surface with uniform emissivity black paint in the experiment. It is found that the surface temperature changes with time satisfying exponential form. Therefore, a robust reducing noise method — exponential fitting of every pixel as a function of time, was presented to eliminate unwanted temporal noise in the raw images. Spatial noise was reduced by the combination some standard filtering algorithms e.g. average filtering with high-pass filtering, which made the invisible defect be detected. Finally, image segmentation algorithms based on watershed and 3D tomogram were used to visualize the defects, and defect's parameters were also estimated by the image after segmentation. The results show that the methods used in this work could improve defect detectability and achieve defect quantitative identification. |
| File Size | 916961 |
| File Format | |
| ISBN | 9781424463473 |
| e-ISBN | 9781424463497 |
| DOI | 10.1109/ICCET.2010.5485708 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-04-16 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Temperature Filtering defect identification Image processing Noise reduction Coatings Image segmentation Infrared Thermography image segmentation Infrared imaging noise filtering Surface fitting debond defect Paints Testing |
| Content Type | Text |
| Resource Type | Article |
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