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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Thonnart, Y. Xuan-Tu Tran Vivet, P. Beigne, E. Clermidy, F. Durupt, J. |
| Copyright Year | 2009 |
| Description | Author affiliation: VNU-Coltech / SIS laboratory - 144 Xuan Thuy Road, 10 000 Hanoi, Vietnam (Xuan-Tu Tran) || CEA-LETI, MINATEC - 17 rue des Martyrs, 38 054 Grenoble, France (Thonnart, Y.; Vivet, P.; Beigne, E.; Clermidy, F.; Durupt, J.) |
| Abstract | The demands of scalable, low latency and power efficient System-On-Chip interconnect cannot be satisfied only by point-to-point or shared-bus interconnects. By providing more bandwidth at reasonable power consumption, new communication infrastructures like NoCs seem promising, but are still limited by implementation issues. We present in this paper an Asynchronous Network-on- Chip architecture with two main innovations. Firstly, an automatic power regulation scheme is proposed to dynamically save leakage and dynamic power consumption. Secondly, due to the current lack of testing methodology for asynchronous logic, we propose a novel DfT solution to allow acceptance of the asynchronous NoC. The proposed architecture has been fully implemented in a STMicroelectronics CMOS 65nm technology, integrated in a complex test-chip and fabricated. |
| Starting Page | 59 |
| Ending Page | 62 |
| File Size | 1042191 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424451395 |
| DOI | 10.1109/ATC.2009.5349340 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-10-12 |
| Publisher Place | Vietnam |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Energy consumption Technological innovation Network-on-a-chip Power system interconnection Bandwidth CMOS technology Design for testability System-on-a-chip Logic testing Delay |
| Content Type | Text |
| Resource Type | Article |
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