NDLI: Application of image processing to laser reflective pattern for multi-layer auto-focusing system

Content Provider	IEEE Xplore Digital Library
Author	Yu-Shih Hsu Wei-Yen Hsu Shu-Duan Fan Hsiang-Yen Lin Chien-Sheng Liu Sheng-Hong Jiang
Copyright Year	2013
Description	Author affiliation: Dept. of Inf. Manage., Nat. Chung Cheng Univ., Chiayi, Taiwan (Yu-Shih Hsu; Wei-Yen Hsu; Shu-Duan Fan; Hsiang-Yen Lin) \|\| Dept. of Mech. Eng. & Adv., Nat. Chung Cheng Univ., Chiayi, Taiwan (Chien-Sheng Liu) \|\| Dept. of Mech. Eng., Nat. Central Univ., Jhongli, Taiwan (Sheng-Hong Jiang)
Abstract	It is very important for laser auto-focusing systems in the applications of precise machining. The reflective laser area which is a semi-circular pattern is usually used to estimate the degree of defocusing. As work piece surface may be different in reflective properties and not always smooth, the reflective pattern is usually not a perfect semi-circle. In this study, a novel image processing algorithm is proposed to overcome this fault. Comparing with the conventional method based on the bias of gravity center, the results indicate that the proposed method can not only reconstruct the desired semi-circle back but also calculate the defocusing distant individually. After we use microscope and obtain images and perform the binary-valued image processing, we can clearly discriminate the border and structure of semicircle images and reduce the complexity of the processing of product images. The purpose of binary-valued processing is to discriminate the objects and background of images, so as to obtain the information of objects. We observe the changes of eccentric distance among images with the increases of the focal distance of microscope to determine the accuracy of microscope. The experiment results have shown the superiority of the sharpness measurement scheme we proposed.
Starting Page	762
Ending Page	765
File Size	448223
Page Count	4
File Format	PDF
ISSN	21568073
e-ISBN	9781467352222
DOI	10.1109/ICSensT.2013.6727755
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-12-03
Publisher Place	New Zealand
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	image processing Histograms Microscopy Image processing Reflective pattern Semicircle Defocusing distance Lasers Focusing Optical imaging Sensors Laser auto-focusing
Content Type	Text
Resource Type	Article

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