NDLI: A remaining useful life prediction method based on condition monitoring for LED driver

Content Provider	IEEE Xplore Digital Library
Author	Yuege Zhou Xiang Li Xuerong Ye Guofu Zhai
Copyright Year	2012
Description	Author affiliation: School of Electrical Engineering and Automation, Harbin Institute of Technology, Heilongjiang, China (Yuege Zhou; Xiang Li; Xuerong Ye; Guofu Zhai)
Abstract	Switching Mode Power Supply (SMPS) is the most important source for electronics and equipment, therefore its reliability acts as a critical factor impacting on their working lifetime. Applications show that aluminum electrolytic capacitors and some power components like diodes and MOSFETs, all of which turn out to be key factors to SMPS' lifetime, are of higher failure rates in SMPS. In fact, the failure of electronic products is a gradual course, which is usually resulted from the degradation of separate electronic components. In this research, the LED driver is regarded as the research object and the experimental study of its degradation is discussed. To study the LED driver degradation owning to these critical components, such as power MOSFETs, diodes and aluminum electrolytic capacitors, the components' performance parameters which can reflect their degradation need monitoring. In order to acquire remarkable effects, accelerated aging test is adopted in this paper. The study of LED driver degradation on basis of the theory of PoF (Physics of Failure) is meaningful to the reliability research of SMPS and provides an approach for the prognostics of its RUL(remaining useful life).
Starting Page	1
Ending Page	5
File Size	2200007
Page Count	5
File Format	PDF
ISBN	9781457719097
ISSN	21665656
e-ISBN	9781457719110
e-ISBN	9781457719103
DOI	10.1109/PHM.2012.6228797
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-05-23
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Capacitors Failure analysis PoF reliability MOSFET circuits Lead Light emitting diodes degradation Integrated circuit reliability LED driver
Content Type	Text
Resource Type	Article

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