NDLI: Transient response of a 3-TFT hybrid active-passive pixel with correlated double sampling CMOS readout circuit for real-time medical X-ray imaging

Content Provider	IEEE Xplore Digital Library
Author	Safavian, N. Wu, D. Karim, K. Nathan, A.
Copyright Year	2008
Description	Author affiliation: Electr. & Comput. Eng. Dept., Univ. of Waterloo, Waterloo, ON (Safavian, N.; Wu, D.; Karim, K.) \|\| London Center for Nanotechnol., Univ. Coll. London, London (Nathan, A.)
Abstract	This paper presents a new hybrid current-programmed, current-output active pixel sensor (APS) suitable for real time x-ray imaging (fluoroscopy) and an off-panel CMOS readout circuit. The pixel circuit is designed using hydrogenated amorphous silicon (a-Si:H) thin film transistor (TFT) technology. Measurement based simulations show that the proposed pixel circuit can successfully compensate for characteristic variations (e.g. mobility and threshold voltage shift) in a-Si:H TFTs under prolonged gate voltage stress. Investigation of the APS transient response shows that the proposed circuit can fulfill the timing requirement of real time imaging. The readout circuit exploits correlated double sampling (CDS) technique to reduce the offset current, low frequency noise and fixed-pattern noise (FPN) on the array operation.
Starting Page	85
Ending Page	88
File Size	909935
Page Count	4
File Format	PDF
ISBN	9781424429202
DOI	10.1109/MNRC.2008.4683384
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-15
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Transient response Circuits CMOS image sensors Sampling methods Threshold voltage Thin film transistors Low-frequency noise Pixel X-ray imaging Biomedical imaging
Content Type	Text
Resource Type	Article

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