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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Su Wei Zhang Shide Xue Lijun |
| Copyright Year | 2008 |
| Description | Author affiliation: Beijing Union Univ., Beijing (Su Wei; Zhang Shide; Xue Lijun) |
| Abstract | This paper describes LASAR V6 (logic automated stimulus response) that is the software for digital test program to generate fault dictionary used as a diagnosis database of fault isolation for a tested circuit based on fault simulation, presents three core files relating to circuit fault diagnosis which is generated by LASAR, i.e. fault dictionary, node truth table and pin connection table, analyses the content of fault dictionary, pin connection table and node truth table, finds the necessary information for fault location, summarizes the procedure of circuit test and fault location. Finally the digital circuit diagnosis system which can locate the fault on the pin of components is designed. With the help of probe, fault location of component pins can be accurately pinpointed. |
| Starting Page | 322 |
| Ending Page | 326 |
| File Size | 267402 |
| Page Count | 5 |
| File Format | |
| ISBN | 9780769532905 |
| DOI | 10.1109/CCCM.2008.253 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-08-03 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Fault diagnosis Dictionaries fault diagnosis LASAR fault dictionary Fault location Software Circuit faults Integrated circuit modeling Probes |
| Content Type | Text |
| Resource Type | Article |
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