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Content Provider | IEEE Xplore Digital Library |
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Author | Yousefi, R. Fakhraie, S.M. |
Copyright Year | 2008 |
Description | Author affiliation: Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran (Yousefi, R.; Fakhraie, S.M.) |
Abstract | A low cost invariant-based online test scheme is proposed for general digital linear time-invariant (LTI) systems. An analytical signal processing approach is used to extract an invariant property of LTI systems in frequency domain. An optimal implementation of the developed technique is also proposed using Goertzel algorithm to reduce area and computational overheads. The overhead is fixed and does not increase as complexity of LTI system increases. Simulation of fault detection capability is done for different filters using developed FLI fault injector platform. This work introduces the frequency domain approach in testing of digital signal processing systems. |
Starting Page | 54 |
Ending Page | 58 |
File Size | 369342 |
Page Count | 5 |
File Format | |
ISBN | 9781424433964 |
DOI | 10.1109/INNOVATIONS.2008.4781742 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2008-12-16 |
Publisher Place | United Arab Emirates |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | System testing Costs Signal processing algorithms Digital signal processing Very large scale integration Electrical fault detection Circuit faults Circuit testing Frequency domain analysis Equations |
Content Type | Text |
Resource Type | Article |
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