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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Friederich, B. Schultze, T. Willms, I. |
| Copyright Year | 2015 |
| Description | Author affiliation: Fachgebiet Nachrichtentech. Syst., Univ. Duisburg-Essen, Duisburg, Germany (Friederich, B.; Schultze, T.; Willms, I.) |
| Abstract | In this paper, a diffraction simulation for dielectric edges is introduced. The simulation is based on geometrical theory of diffraction (GTD) and is implemented as an improvement of the millimeter-wave surface characterization. This material characterization technique has been introduced in [1] and uses the microwave ellipsometry. The subject of current investigations is the usage of autonomous security robots for the detection of hot spots, the localization and characterization of objects. These robots should support fire brigades or disaster relief teams by millimeter-wave surface characterization. The developed technique was inspired by the established optical ellipsometry. The optical characterization technique does not consider the effect diffraction at the edges of the surface. Hence, the ellipsometry is limited to large surfaces where the diffraction effects can be neglected, but for the supposed application it is necessary to compensate these effects. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 181122 |
| Page Count | 4 |
| File Format | |
| e-ISBN | 9781467365550 |
| DOI | 10.1109/ICUWB.2015.7324523 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-10-04 |
| Publisher Place | Canada |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Diffraction Permittivity measurement Estimation Dielectrics Permittivity Optical surface waves Ellipsometry |
| Content Type | Text |
| Resource Type | Article |
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