NDLI: Learning the Relative Importance of Features in Image Data

Content Provider	IEEE Xplore Digital Library
Author	Varde, A. Rundensteiner, E. Javidi, G. Sheybani, E. Jianyii Liang
Copyright Year	2007
Description	Author affiliation: Virginia State Univ., Petersburg (Varde, A.)
Abstract	In computational analysis in scientific domains, images are often compared based on their features, e.g., size, depth and other domain-specific aspects. Certain features may be more significant than others while comparing the images and drawing corresponding inferences for specific applications. Though domain experts may have subjective notions of similarity for comparison, they seldom have a distance function that ranks the image features based on their relative importance. We propose a method called features rank for learning such a distance function in order to capture the semantics of the images. We are given training samples with pairs of images and the extent of similarity identified for each pair. Using a guessed initial distance function. Features rank clusters the given images in levels. It then adjusts the distance junction based on the error between the clusters and training samples using heuristics proposed in this paper. The distance junction that gives the lowest error is the output. This contains the features ranked in the order most appropriate the domain. Features rank is evaluated with real image data from nanotechnology and bioinformatics. The results of our evaluation are presented in the paper.
Starting Page	237
Ending Page	244
File Size	377243
Page Count	8
File Format	PDF
ISBN	9781424408313
DOI	10.1109/ICDEW.2007.4400998
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-04-17
Publisher Place	Turkey
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Computer science Scanning electron microscopy Image analysis Transmission electron microscopy Engineering drawings Etching Iterative methods Mechanical engineering Bioinformatics Nanotechnology
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Structure and mechanical behavior of submicrocrystalline /spl alpha/-Fe

Real case studies of failure mechanisms for Cu trench electromigration

Crystallographic image processing for scanning probe and transmission electron microscopy

Student-Centered Microsystem and Nanotechnology Courses and Laboratories for Mechanical Engineering Students

Electron Microscopy and Failure Analysis

Parallel EELS elemental mapping in scanning transmission electron microscopy: use of the difference methods

Phases and interfaces from real space atomically resolved data: Physics-based deep data image analysis

Probing plasmons in three dimensions by combining complementary spectroscopies in a scanning transmission electron microscope

Current measurement of mechanically stretched nanowire with transmission electron microscope direct observation

Learning the Relative Importance of Features in Image Data

Similar Documents

Structure and mechanical behavior of submicrocrystalline /spl alpha/-Fe

Real case studies of failure mechanisms for Cu trench electromigration

Crystallographic image processing for scanning probe and transmission electron microscopy

Student-Centered Microsystem and Nanotechnology Courses and Laboratories for Mechanical Engineering Students

Electron Microscopy and Failure Analysis

Parallel EELS elemental mapping in scanning transmission electron microscopy: use of the difference methods

Phases and interfaces from real space atomically resolved data: Physics-based deep data image analysis

Probing plasmons in three dimensions by combining complementary spectroscopies in a scanning transmission electron microscope

Current measurement of mechanically stretched nanowire with transmission electron microscope direct observation

Learning the Relative Importance of Features in Image Data