NDLI: A Quantitative Assessment of 3D Facial Key Point Localization Fitting 2D Shape Models to Curvature Information

Content Provider	IEEE Xplore Digital Library
Author	Sukno, F.M. Chowdhury, T.A. Waddington, J.L. Whelan, P.F.
Copyright Year	2011
Description	Author affiliation: Mol. & Cellular Therapeutics, R. Coll. of Surgeons in Ireland, Dublin, Ireland (Waddington, J.L.) \|\| Centre for Image Process. & Anal., Dublin City Univ., Dublin, Ireland (Sukno, F.M.; Chowdhury, T.A.; Whelan, P.F.)
Abstract	This work addresses the localization of 11 prominent facial landmarks in 3D by fitting state of the art shape models to 2D data. Quantitative results are provided for 34 scan sat high resolution (texture maps of 10 M-pixels) in terms of accuracy (with respect to manual measurements) and precision(repeatability on different images from the same individual). We obtain an average accuracy of approximately 3 mm, and median repeatability of inter-landmark distances typically below2 mm, which are values comparable to current algorithms on automatic localization of facial landmarks. We also show that, in our experiments, the replacement of texture information by curvature features produced little change in performance, which is an important finding as it suggests the applicability of the method to any type of 3D data.
Starting Page	26
Ending Page	31
File Size	3204847
Page Count	6
File Format	PDF
ISBN	9781467302302
e-ISBN	9780769546292
DOI	10.1109/IMVIP.2011.14
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-09-07
Publisher Place	Ireland
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Adaptation models Accuracy Shape image topography Nose eye tracking Manuals iris detection Three dimensional displays Face
Content Type	Text
Resource Type	Article

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