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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Nguyen, T.T. Kuiyu Chang Siu Cheung Hui |
| Copyright Year | 2011 |
| Description | Author affiliation: School of Computer Engineering, Nanyang Technological University, China (Nguyen, T.T.; Kuiyu Chang; Siu Cheung Hui) |
| Abstract | Vector space text classification is commonly used in intelligence applications such as email and conversation analysis. In this paper we propose a supervised term weighting scheme called tƒ × KL (term frequency Kullback-Leibler), which weights each word proportionally to the ratio of its document frequency across the positive and negative class. We then generalize tƒ × KL to effectively deal with class imbalance, which is very common in real world intelligence analysis. The generalized tƒ × KL weights each word according to the ratio of the positive and negative class conditioned word probabilities instead of the raw document frequencies. Results on four classification datasets show tƒ × KL to perform consistently better than the baseline tƒ ×idƒ and 4 other supervised term weighting schemes, including the recently proposed tƒ × rƒ (term frequency relevance frequency). The generalized tƒ × KL was found to be extremely robust in dealing with highly skewed class distributions, beating the second runner-up by more than 20% on a dataset that has only 10% positive training examples. The generalized tƒ × KL is thus an effective and robust term weighting scheme that can significantly improve binary classification performance in sentiment analysis and intelligence applications. |
| Starting Page | 89 |
| Ending Page | 94 |
| File Size | 1579307 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781457700828 |
| e-ISBN | 9781457700859 |
| DOI | 10.1109/ISI.2011.5984056 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-07-10 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Support vector machines Communities Benchmark testing Educational institutions |
| Content Type | Text |
| Resource Type | Article |
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