NDLI: Towards Constraing-Based Local Search for Automatic Test Data Generation

Content Provider	IEEE Xplore Digital Library
Author	Gotlieb, A. Lazaar, N. Lebbah, Y.
Copyright Year	2008
Description	Author affiliation: IRISA-INRIA, Rennes (Gotlieb, A.)
Abstract	Constraint-Based Testing was introduced fifteen years ago, in the context of mutation testing [1], to generate test cases by using constraint solving techniques. In our previous work [2, 3], we built a constraint-based model for generating automatically test data that cover all the decisions of a C program. Constraints are solved by using classical deductive methods such as domain reduction over finite domains and complete labelling. However, we found that some constraint systems cannot be solved in a reasonable amount of time with these techniques. Hence, we started looking at constraint-based local search (CBLS), a framework introduced by Michel and Van Hentenryck [4], to speed up the test data generation process in constraint-based testing. CBLS is a generic paradigm that proposes to implement multiple local search techniques such as Hill-climbing and simulated annealing by using the high-level concepts of invariants and differentiable objects. Invariants are simple relations expressed over incremental variables that must be maintained under assignments of new values while differentiable objects are relations that can be queried to evaluate the effect of local moves. Their significance comes from the many algorithms that evaluate the effect of various moves before selecting the neighbor to visit. Unlike invariants, a differentiable object can be queried through an interface shown below to evaluate the effect of local moves such as assignments and swaps.
Starting Page	195
Ending Page	195
File Size	148909
Page Count	1
File Format	PDF
ISBN	9780769533889
DOI	10.1109/ICSTW.2008.49
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-04-09
Publisher Place	Norway
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Software testing Automatic testing USA Councils Conferences Genetic mutations Simulated annealing Computer architecture Electrical capacitance tomography Labeling Cost accounting
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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