NDLI: Frontside laser fault injection on cryptosystems - Application to the AES' last round -

Content Provider	IEEE Xplore Digital Library
Author	Roscian, C. Dutertre, J.-M. Tria, A.
Copyright Year	2013
Description	Author affiliation: Dept. Syst. et Archit. Securisees (SAS), Ecole Nat. Super. des Mines de St.-Etienne (ENSMSE), Gardanne, France (Roscian, C.; Dutertre, J.-M.) \|\| Dept. Syst. et Archit. Securisees (SAS), CEA-Tech, Gardanne, France (Tria, A.)
Abstract	Laser fault injection through the front side (and consequently the metal-flls) of an IC is often performed with medium or small laser beams for the purpose of injecting bytewise faults. We have investigated in this paper the properties of fault injection with a larger laser beam (in the 100/im range). We have also checked whether the bit-set (or bit-reset) fault type still holds or whether the bit-fip fault type may be encountered. Laser injection experiments were performed during the last round of the Advanced Encryption Standard (AES) algorithm running on an ASIC. The gathered data allowed to investigate the obtained fault models, to conduct two usual Differencial Fault Attack (DFA) schemes and to propose a simple version of a third DFA.
Starting Page	119
Ending Page	124
File Size	357036
Page Count	6
File Format	PDF
ISBN	9781479905591
e-ISBN	9781479906017
DOI	10.1109/HST.2013.6581576
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-06-02
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	laser fault injection fault model Semiconductor lasers Inverters Laser beams Circuit faults Laser applications Laser transitions Transient analysis DFA AES
Content Type	Text
Resource Type	Article

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