NDLI: Multi-valued logic test access mechanism for test time and power reduction

Content Provider	IEEE Xplore Digital Library
Author	Nekooei, A. Navabi, Z.
Copyright Year	2015
Description	Author affiliation: Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran (Nekooei, A.; Navabi, Z.)
Abstract	Test time reduction is an important objective in SoC testing. This becomes harder to achieve when power management techniques, like dynamic voltage scaling, are used, that requires a core to be tested for all its operating voltages. Coupling test time with test power consumption, due to long interconnects and switching power consumption, creates a difficult situation for SoC testing. To cope with this issue, this paper proposes a new Test Access Mechanism (TAM) that uses Multi-Valued Logic (MVL). In this structure, test data going to cores with MVL technique through the same test bus. This paper proposes Binary-MVL converters, and structure of test data on a multi-voltage test bus. This arrangement also reduces test time in multi-VDD SoCs as well. We have analyzed on crosstalk noise, area and power overhead of the proposed structure. In addition, we use IEEE 1450 - Standard Test Interface Language (STIL) to send and receive MVL signal in the Automatic Test Equipment (ATE) side. We also present a Mixed-Integer Linear Programming (MILP) model for optimal test scheduling based on our new TAM structure. Experimental results for ITC'02 benchmark highlight the effectiveness of the proposed structure.
Starting Page	1
Ending Page	6
File Size	462572
Page Count	6
File Format	PDF
ISBN	9781479919994
DOI	10.1109/DTIS.2015.7127351
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-04-21
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Multi-Valued Logic Power demand Crosstalk Bandwidth Test Access Mechanism Scheduling System-on-chip Delays SoCs Mathematical model Testing Test Time
Content Type	Text
Resource Type	Article

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