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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Xinrui Guo Xiaoyu Song Hung, W.N.N. Ming Gu Jiaguang Sun |
| Copyright Year | 2014 |
| Description | Author affiliation: Sch. of Software, Tsinghua Univ., Beijing, China (Xinrui Guo; Ming Gu; Jiaguang Sun) || Synopsys Inc., Mountain View, CA, USA (Hung, W.N.N.) || Dept. ECE, Portland State Univ., Portland, OR, USA (Xiaoyu Song) |
| Abstract | Fault localization is a critical procedure in software development process. Previous studies based their research on the precondition that test results are conveniently acquired and 100% correct, which does not happen in the real world. In this article, we propose the concept of γ- reliable test-suite to demonstrate the potential unreliability of test results. By modeling this unreliability using Dempster-Shafer theory, we managed to pin down the faults under the new situation. Experiments were conducted on both 100%-reliable and partial-reliable Siemens Test Suite and compared against several known spectrum-based localization algorithms, namely Naish1, Naish2, Binary, Wong1 and Russel&Rao. The results proved the prior performance of our approach. We conclude that fault localization problem is more precisely modeled by Dempster-Shafer theory than common statistical theory. |
| Starting Page | 58 |
| Ending Page | 65 |
| File Size | 387541 |
| Page Count | 8 |
| File Format | |
| ISBN | 9781479950294 |
| DOI | 10.1109/TASE.2014.36 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-09-01 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Uncertainty Accuracy fault localization Estimation Reliability theory Software partial reliable test results Dempster-Shafer Theory Testing |
| Content Type | Text |
| Resource Type | Article |
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