NDLI: Digital Signal Processing Based Waveform Generator for Flickermeter Calibration Test System

Content Provider	IEEE Xplore Digital Library
Author	Huoy, S.L. Jamuar, S.S. Sidek, R.M. Marhaban, M.H.
Copyright Year	2006
Description	Author affiliation: Dept. of Electr. & Electron. Eng., Univ. Putra Malaysia, Serdang (Huoy, S.L.; Jamuar, S.S.; Sidek, R.M.; Marhaban, M.H.)
Abstract	This paper describes a method of waveform generation using digital signal processing processor for flickermeter calibration test system. Flickermeter is a power analyzer designed to quantify to what degree the light intensity variation caused by voltage changes will irritate test subjects. Calibration test system for flickermeters is a system used to generate and measure accurately all the modulated test signals required for testing flickermeters [1]. Two waveform generators are needed in the system to produce the test conditions; one represents the mains frequency, generating frequency of 50 Hz while another represents the modulating frequency, generating frequencies from 2-25 Hz. The modulating frequencies, acting as flicker, are to be applied with the main frequency, resulting in modulation of frequencies. The DSP processor TMS320C6713DSK with code composer studio has been used to generate the two waveforms. It generates waveforms with different frequencies by using the look-up tables for the required waveforms up to 32 kHz. The required waveform, amplitude, and frequency can be programmed by the user. The DSP processor has also been programmed to produce amplitude modulated signal. Using the stereo audio codec of the kit, two difference types of frequencies have been generated simultaneously.
Starting Page	108
Ending Page	111
File Size	270558
Page Count	4
File Format	PDF
ISBN	9781424405268
DOI	10.1109/SCORED.2006.4339319
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-06-27
Publisher Place	Malaysia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	System testing Voltage fluctuations Frequency modulation Codecs Digital signal processing Signal processing Signal generators Amplitude modulation Calibration Modulation coding
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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