NDLI: Effect of strain on magnetoresistance and magnetic properties of Co (tCo)/Ag nanostructures

Content Provider	IEEE Xplore Digital Library
Author	Rizal, C. Gyawali, P. Kshattry, I. Ueda, Y. Pokharel, R.K.
Copyright Year	2011
Description	Author affiliation: Laboratory for Nanospintronics and Nanoelectronics, Catholic University of America, 620 Michigan Ave., N.E., Washington, DC, 20064, USA (Gyawali, P.) \|\| Department of Electrical and Electronic Engineering, Muroran Institute of Technology, 27-1, Mizumoto-cho, Muroran-shi, Hokkaido, 050-8585, Japan (Ueda, Y.) \|\| Vancouver, BC, Canada (Kshattry, I.) \|\| E-JUST Center, Department of Electrical and Communication Engineering, Kyushu University, Fukuoka, 819-0395, Japan (Pokharel, R.K.) \|\| Department of Electrical and Computer Engineering, University of British Columbia, Vancouver, V6T 1Z4, Canada (Rizal, C.)
Abstract	A series of [Co (tCo) nm/Ag 1.5 nm]50 nanostructures was grown using pulse electrodeposition onto polyimide substrates. The magnetoresistance (MR) ratio was examined as the Co layer thickness changed. A strain was induced mechanically, and this resulted in magnetic anisotropy. Magnetization curves were recorded as the strain was changed. The measured degree of magnetic anisotropy best fits linearly with the increase of strain. The MR values for the nanostructure with the field perpendicular to the easy axis and the direction of current are found to be larger than those of the field parallel to the easy axis and the direction of current. A maximum MR ratio of 9.1 % was observed for the [Co 1.5 nm/Ag 1.5 nm]50 nanostructure. The nanostructures showed remarkable magnetic properties owing to the induced strain.
Starting Page	120
Ending Page	124
File Size	933129
Page Count	5
File Format	PDF
ISBN	9781457721397
e-ISBN	9781457721410
DOI	10.1109/NMDC.2011.6155324
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-10-18
Publisher Place	Korea (South)
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Anisotropic magnetoresistance Copper Perpendicular magnetic anisotropy Thickness measurement
Content Type	Text
Resource Type	Article

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