NDLI: A test automation framework in POCT system using TDD techniques

Content Provider	IEEE Xplore Digital Library
Author	Chaipraserth, R. Leelasantitham, A. Kiattisin, S.
Copyright Year	2013
Description	Author affiliation: Technol. Inf. Syst. Manage. Program, Mahidol Univ., Nakorn Pathom, Thailand (Chaipraserth, R.; Leelasantitham, A.; Kiattisin, S.)
Abstract	Nowadays, the growth of IT business are highly competitive both of development process and functionality of software to meet mostly customer requirements. Normally, software performance should develop to increase the high quality whilst it should reduce both of the cost and the time. The IT business is to start the attention with satisfaction of the customer for expanding opportunities of grown business. The problem of former software development is an operation under the pressure conditions affecting to see more bugs of the software in a period of testing system and delivering the program to the required customer. This paper presents an implementation of approach which is an agile development (If what we do that able to modify the code to meet the requirement in the future, that's call agile.) using Test Driven Development (TDD) in automation testing framework for software development process. It helps optimization of software testing as it can found early bug, flexible for requirement changes in the future, either to increase or change requirement without any effect on coding behavior. It also helps to reduce cost of software development as a human resource, time and rapid feedback of test result. We apply this approach with prototype in software development processes using the Point of care testing (POCT) system which is as an example to create test case with black-box and white-box testing techniques based on the requirements specification to improve more product quality.
Starting Page	600
Ending Page	604
File Size	1065015
Page Count	5
File Format	PDF
e-ISBN	9781467355803
DOI	10.1109/ISCIT.2013.6645931
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-09-04
Publisher Place	Thailand
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Software testing Automation Computer bugs Test cases generation Encyclopedias Software Test Process Software White-box testing Test Driven Development Black-box testing Monitoring Testing process
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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