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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Kolkoori, S. Wrobel, N. Ewert, U. |
| Copyright Year | 2015 |
| Description | Author affiliation: Dept. of Non-Destruct. Testing, BAM Fed. Inst. for Mater. Res. & Testing, Berlin, Germany (Kolkoori, S.; Wrobel, N.; Ewert, U.) |
| Abstract | In order to enhance the supply chain security at airports, the German federal ministry of education and research has initiated the project ESECLOG (enhanced security in the air cargo chain) which has the goal to improve the threat detection accuracy using one-sided access methods. In this paper, we present a new X-ray backscatter technology for non-intrusive imaging of suspicious objects (mainly low-Z explosives) in luggage's and parcels with only a single-sided access. A key element in this technology is the X-ray backscatter camera embedded with a special twisted-slit collimator. The developed technology has efficiently resolved the problem related to the imaging of complex interior of the object by fixing source and object positions and changing only the scanning direction of the X-ray backscatter camera. Experiments were carried out on luggages and parcels packed with mock-up dangerous materials including liquid and solid explosive simulants. In addition, the quality of the X-ray backscatter image was enhanced by employing high-resolution digital detector arrays. Experimental results are discussed and the efficiency of the present technique to detect suspicious objects in luggages and parcels is demonstrated. At the end, important applications of the proposed backscatter imaging technology to the aviation security are presented. |
| Starting Page | 1 |
| Ending Page | 5 |
| File Size | 901933 |
| Page Count | 5 |
| File Format | |
| e-ISBN | 9781479917372 |
| DOI | 10.1109/THS.2015.7225329 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-04-14 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | digital radiography luggage inspection Collimators detection of dangerous materials security applications Detectors Inspection Cameras one-sided access method X-ray imaging Backscatter X-ray backscatter imaging |
| Content Type | Text |
| Resource Type | Article |
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