NDLI: Performance evaluation of high-voltage circuit breakers by means of current zero analysis

Content Provider	IEEE Xplore Digital Library
Author	Smeets, R.P.P. Kertesz, V. Nishiwaki, S. Suzuki, K.
Copyright Year	2002
Description	Author affiliation: KEMA High-Power Lab., Arnhem, Netherlands (Smeets, R.P.P.; Kertesz, V.)
Abstract	Proper combination of fast, high-resolution analogue to digital converters, optical signal transfer and digital signal processing tools with advanced current and voltage measurement sensors has led to the development of a compact current zero measurement system for application in high-power laboratories as an aid in testing SF/sub 6/ circuit breakers. The application of this system in the renovated high-power laboratory of Toshiba Co is described, including the results of short-line fault tests in the range 16-70 kA on a 300 kV single break model circuit breaker. Three levels of information on the 'quality of interruption', obtained from current zero measurements are discussed: (1) direct observation of post-arc current, arc voltage collapse phenomena, commutation process of arc current into (stray-) capacitance etc.; (2) the arc conductivity very shortly (200 ns) before current zero, an indicator of the performance of the breaker under test. A new quantitative method of electrical endurance mapping is presented; and (3) arc model parameters are extracted out of every individual test, that enable prediction of the performance under other conditions than those tested (e.g. with an internal capacitor).
Starting Page	424
Ending Page	429
File Size	739129
Page Count	6
File Format	PDF
ISBN	0780375254
DOI	10.1109/TDC.2002.1178398
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-10-06
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	System testing Circuit breakers Current measurement Laboratories Signal processing Performance analysis Optical sensors Circuit testing Optical signal processing Analog-digital conversion
Content Type	Text
Resource Type	Article

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