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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hamada, H. Eto, A. Maekawa, T. Koshizuka, T. Nishiwaki, S. Miyake, N. Arai, K. Kosakada, M. |
| Copyright Year | 2002 |
| Description | Author affiliation: Tokyo Electr. Power Co. Inc., Japan (Hamada, H.; Eto, A.; Maekawa, T.) |
| Abstract | RDDS (rate of decrease of dielectric strength) is one of the important characteristics of the circuit breaker for applying controlled closing technology. This characteristic is supposed to be affected by contacts roughness and consumption of the circuit breaker caused by rated current or short circuit current interruptions. Also the number of interruptions of the circuit breaker influences the RDDS characteristic. In this paper, the influence of the contact wearing of the circuit breaker by current interruptions to the RDDS was investigated. In a high-power laboratory, the RDDS of a high-voltage one-break circuit breaker was measured at three conditions as follows: before current interruptions; after rated current interruptions; and after short circuit current interruptions. In the field, the RDDS characteristics using another one-break circuit breaker were measured. The results showed that current interruptions have little influence on the RDDS. It is possible to apply controlled closing to circuit breakers after current interruptions. The RDDS calculated by electric field analysis was in good agreement with measurements. |
| Starting Page | 1755 |
| Ending Page | 1759 |
| File Size | 260073 |
| Page Count | 5 |
| File Format | |
| ISBN | 0780375254 |
| DOI | 10.1109/TDC.2002.1177720 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2002-10-06 |
| Publisher Place | Japan |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Short circuit currents Circuit breakers Current measurement Laboratories Dielectric measurements Voltage Control systems Dielectric breakdown Circuit testing Switching circuits |
| Content Type | Text |
| Resource Type | Article |
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