NDLI: Monitoring of influence of significant parameters during anodizing of aluminium

Content Provider	IEEE Xplore Digital Library
Author	Michaf, P. Vagaska, A. Gombar, M. Hosovsky, A. Kmec, J.
Copyright Year	2014
Description	Author affiliation: Dept. of Math., Inf. & Cybern., Tech. Univ. of Kosice, Presov, Slovakia (Michaf, P.; Vagaska, A.; Hosovsky, A.) \|\| Dept. of Manage., Univ. of Presov in Presov, Presov, Slovakia (Gombar, M.; Kmec, J.)
Abstract	The paper deals with the possibilities of control the technological process of aluminium anodic oxidation using the Design of Experiments (DoE) and the higher order neural unit to monitor the influence of the significant parameters on the resulting AAO (anodic aluminium oxide) film thickness. It also compares the relationship between individual inputs factors and their mutual interactions on the AAO thickness at monitored current density of 1.00 $A·dm^{-2}$ and 6.00 $A·dm^{-2}.$ The developed predicted model describes the influence of input factors on the final AAO thickness by cubic function and its reliability is 99.37 % at current density of 1 $A·dm^{-2}$ and 99.47% at current density of 6 $A·dm^{-2}.$ The electrolyte temperature and the size of an applied voltage had the most important influence.
Sponsorship	IEEE Hungary Sect.
Starting Page	49
Ending Page	54
File Size	466873
Page Count	6
File Format	PDF
ISBN	9781479934416
e-ISBN	9781479934423
DOI	10.1109/SAMI.2014.6822447
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-01-23
Publisher Place	Slovakia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Training layer thickness Aluminum anodizing Predictive models neural unit Vectors Current density Thickness measurement thin films
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Application of neural networks to evaluate experimental data of galvanic zincing

Layer thickness measurement of technically anodised aluminium surfaces by using goniometric scattered light

Modelling of the anodizing process of aluminum using neural networks

Failure of Small Thin Film Conductors Due to High Current-Density Pulses

Property of the Anodizing Films on Aluminum Formed at High Current Density

The Influence of Input Factors of Aluminium Anodizing Process on Resulting Thickness and Quality of Aluminium Oxide Layer

Conduction through thin metal, metal oxide structures

Electromigration and 1/f Noise of Aluminum Thin Films

In situ simultaneous measurement of temperature and thin film thickness with ultrasonic techniques

Monitoring of influence of significant parameters during anodizing of aluminium

Similar Documents

Application of neural networks to evaluate experimental data of galvanic zincing

Layer thickness measurement of technically anodised aluminium surfaces by using goniometric scattered light

Modelling of the anodizing process of aluminum using neural networks

Failure of Small Thin Film Conductors Due to High Current-Density Pulses

Property of the Anodizing Films on Aluminum Formed at High Current Density

The Influence of Input Factors of Aluminium Anodizing Process on Resulting Thickness and Quality of Aluminium Oxide Layer

Conduction through thin metal, metal oxide structures

Electromigration and 1/f Noise of Aluminum Thin Films

In situ simultaneous measurement of temperature and thin film thickness with ultrasonic techniques

Monitoring of influence of significant parameters during anodizing of aluminium