NDLI: Improving flash memory reliability with dynamic thresholds: Signal processing and coding schemes

Content Provider	IEEE Xplore Digital Library
Author	Wang Kang Youguang Zhang Mingbang Wang Guoyan Li
Copyright Year	2012
Description	Author affiliation: Department of Electronic and Information Engineering, Beihang University, BUAA, Beijing 100191, China (Wang Kang; Youguang Zhang; Mingbang Wang; Guoyan Li)
Abstract	The storage reliability of the flash memory suffers from serious challenges due to various noises such as inter-cell coupling interference and retention process, especially as the device size continuously scales down and the number of cell state levels increases up. Since the threshold voltage distributions shift because of these noises, the conventional pre-defined fixed thresholds will cause misreading errors when read the data. Motivated by the unidirectional shift characteristic of the voltage distributions caused by inter-cell coupling interference and retention process, this paper proposed the concept of dynamic thresholds, including dynamic verification thresholds (DVTs) and dynamic read thresholds (DRTs) to improve the flash reliability. Moreover, based on the dynamic thresholds, we also presented a signal processing scheme with DVTs to compensate the inter-cell coupling interference, and introduced two coding schemes with DRTs for tolerating the retention process, which can also be generalized to asymmetric channels. Analyses and simulation results show that the raw bit error rate (BER) can be significantly reduced by using dynamic thresholds.
Starting Page	161
Ending Page	166
File Size	315756
Page Count	6
File Format	PDF
ISBN	9781467326988
e-ISBN	9781467326995
e-ISBN	9781467326971
DOI	10.1109/ChinaCom.2012.6417468
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-08-08
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Couplings retention process Bit error rate Flash memory Interference Threshold voltage Encoding Decoding dynamic thresholds Inter-cell coupling interference
Content Type	Text
Resource Type	Article

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