NDLI: Analysis and correction of the nonuniformity of light field in the high resolution X-ray digital radiography

Content Provider	IEEE Xplore Digital Library
Author	Wei Li Qing Hou
Copyright Year	2010
Description	Author affiliation: Modern Education Technology and Network Center, Shaanxi University of Chinese Medicine, Xianyang, 712046, China (Qing Hou) \|\| School of Information Engineering, Chang' an University, Xi' an, Shaanxi 710064, China (Wei Li)
Abstract	The nonuniformity of light field in the X-ray digital radiography will cause the sensitivity and resolution of the digital X-ray detection decline. And the causes of the nonuniformity of X-ray image light field are the nonuniformity of the X-ray source intensity, nonuniformity of the double proximity focusing X-ray image intensifier response and nonuniformity of the lens vignetting, CCD dark current and light response. A correction method is proposed based on this analysis, this method obtains correction matrix by experiment and bring forth proper correction parameters to the correction matrix to correct the digital image light field. An correction experiment was done to a step-like aluminum block under the microfocus X-ray source, the outcome indicated that the nonuniformity of the radiographic has been apparently proved and the inspection sensitive and resolution of the image has been proved.
Starting Page	3803
Ending Page	3807
File Size	945634
Page Count	5
File Format	PDF
ISBN	9781424459582
e-ISBN	9781424459612
DOI	10.1109/ICNC.2010.5583016
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-08-10
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Charge coupled devices Radiography image nonuniformity nonuniformity correction double proximity focusing X-ray image intensifier Image intensifiers Dark current radiography X-ray imaging Pixel Lenses
Content Type	Text
Resource Type	Article

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