NDLI: Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms

Content Provider	IEEE Xplore Digital Library
Author	Jia Keat Lee Phon-Amnuaisuk, S. Huat Chin Chew Chin Kuan Ho
Copyright Year	2007
Description	Author affiliation: Multimedia Univ., Cyberjaya (Jia Keat Lee; Phon-Amnuaisuk, S.)
Abstract	Due to the circuit complexity and the number of parameters involved, test relationship of a Test Program (TP) might not be fully discovered. Traditionally, TP setup are defined based on the domain expertise and gathered experience of an engineer. Such judgment is time consuming and could be inefficient especially when new products and technologies are rapidly developed for the competing market. If the complexity of a TP increases, the undetected interrelationship among tests in a TP will also increase. In this paper, inferences are performed to a huge and complex TP using different classification algorithms, with the primary goal to discover potential test relationships in a fast and efficient way. The mining output can be used as a reference and basis for test engineers to improve TP setup or to reprogram test machine to replace current exhaustive test policy.
Starting Page	343
Ending Page	347
File Size	287303
Page Count	5
File Format	PDF
ISBN	0769530451
DOI	10.1109/ISITC.2007.45
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-11-23
Publisher Place	South Korea
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Algorithm design and analysis Performance evaluation Process design Data analysis Inference algorithms Manufacturing Classification algorithms Complexity theory Circuit testing Information technology
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

New caching algorithms performance evaluation

Research on Classification Rule Based on Backtracking Ant Colony Algorithm

RIDDLE: a foundation for test generation on a high level design description

A Test Case Design Algorithm Based on Priority Techniques

An improved hierarchical classification algorithm for structural analysis of integrated circuits

Data-path testability analysis based on BDDs

An improved classification algorithm on teaching evaluation

Test Database Analysis - Inferences from a Disposition Tree

Visualizing Classifier Performance on Different Domains

Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms

Similar Documents

New caching algorithms performance evaluation

Research on Classification Rule Based on Backtracking Ant Colony Algorithm

RIDDLE: a foundation for test generation on a high level design description

A Test Case Design Algorithm Based on Priority Techniques

An improved hierarchical classification algorithm for structural analysis of integrated circuits

Data-path testability analysis based on BDDs

An improved classification algorithm on teaching evaluation

Test Database Analysis - Inferences from a Disposition Tree

Visualizing Classifier Performance on Different Domains

Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms