NDLI: Atomic Force Microscopy Helps to Develop Methods for Physical Detection of Cancerous Cells

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Atomic Force Microscopy Helps to Develop Methods for Physical Detection of Cancerous Cells

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Author index

Publisher's Information

2009 Third International Conference on Quantum, Nano and Micro Technologies

Second International Conference on Quantum, Nano and Micro Technologies (ICQNM 2008)

2007 First International Conference on Quantum, Nano, and Micro Technologies (ICQNM'07)

Atomic Force Microscopy Helps to Develop Methods for Physical Detection of Cancerous Cells

Content Provider	IEEE Xplore Digital Library
Author	Gaikwad, R. Iyer, S. Guz, N. Volkov, D. Dokukin, M. Sokolov, I. Woodworth, C.D.
Copyright Year	2010
Abstract	Humans are still far from defeating cancer. Early detection of cancer will decrease fatality from this disease. Traditional methods of identification of cancerous cells are mainly based on regular techniques used in biology, such as visual identification of maligant changes, cell growth analysis, specific ligand-receptor labeling, or genetic tests. After many years of research, these methods are still either insufficiently accurate or require a lengthy complicated analysis. It has been recently shown that the atomic force microscopy (AFM) method can be useful in the search for alternative methods for a reliable detection of cancer cells. Here we describe the atomic force microscopy (AFM) study of malignant and normal cells cultured from human cervix. Studying adhesion of AFM probes to both of these types of cells, we found that the adhesion can be statistically different. This finding allows us to propose two novel methods for detection cancer cells by using fluorescent silica beads. The methods show high sensitivity to detect cancer in-vitro. Nevertheless, more statistical data will be needed to determine the actual accuracy of the methods.
Starting Page	18
Ending Page	22
File Size	565910
Page Count	5
File Format	PDF
ISBN	9781424458073
e-ISBN	9781424458080
DOI	10.1109/ICQNM.2010.10
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-02-10
Publisher Place	Netherlands Antilles
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Atomic force microscopy Humans Cancer detection Physical and chemical aspects of cellular and intercellular structure Diseases Adhesives Cells (biology) Cancer cells Cell adhesion Genetics Labeling Probes Testing
Content Type	Text
Resource Type	Article

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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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