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Content Provider | IEEE Xplore Digital Library |
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Author | Prommesberger, C. Langer, C. Lawrowski, R. Dams, F. Schreiner, R. |
Copyright Year | 2015 |
Description | Author affiliation: Fac. of Gen. Sci. & Microsyst. Technol., OTH Regensburg, Regensburg, Germany (Prommesberger, C.; Langer, C.; Lawrowski, R.; Dams, F.; Schreiner, R.) |
Abstract | We report on gated p-type Si-tip array cathodes for implementation into field emission electron sources for sensor applications. Arrays of 16 and 100 tips with tip heights of 3 μm and tip radii below 30 nm with integrated gate electrodes concentrically positioned 2 μm below the tip apexes were fabricated using an improved process, which leads to an enhanced isolation layer quality with sufficient breakdown field strengths and low leakage currents. Integral measurements with a fixed grid potential of 400 V showed emission currents up to 35 μA for 100 tips at a cathode voltage of 150 V and an almost negligible parasitic gate current. The array with 16 p-type Si-tips showed a significant stabilization of the emission current in the range of 0.3 - 0.4 μA, for cathode voltages between 90 V and 150 V. The current fluctuation in this saturation regime was measured for 10 minutes and a value of less than ± 1% was observed. No degradation of the cathode was found after 6 hours of operation at a constant cathode voltage of 100 V and a constant grid voltage of 400 V. |
Starting Page | 164 |
Ending Page | 165 |
File Size | 299512 |
Page Count | 2 |
File Format | |
ISBN | 9781467393560 |
e-ISBN | 9781467393577 |
DOI | 10.1109/IVNC.2015.7225567 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2015-07-13 |
Publisher Place | China |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Cathodes Logic gates Current measurement Silicon Semiconductor device measurement Iron current stabilization field emission semiconductor silicon tip array integrated gate-electrode |
Content Type | Text |
Resource Type | Article |
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