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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Chiwon Lee Kanungo, P.D. Guzenko, V. Hefenstein, P. Tsujino, S. Kassier, G. Casandruc, A. Miller, R.J.D. |
| Copyright Year | 2014 |
| Description | Author affiliation: CFEL, Max Planck Inst. for Struct. & Dynamics of Matter, Hamburg, Germany (Kassier, G.; Casandruc, A.; Miller, R.J.D.) || Lab. for Micro- & Nanotechnol., Paul Scherrer Inst., Villigen, Switzerland (Chiwon Lee; Kanungo, P.D.; Guzenko, V.; Hefenstein, P.; Tsujino, S.) |
| Abstract | We study field emission characteristics of an all-metal double-gate single nanotip emitter to explore the feasibility of such emitters for applications that require extremely high beam brightness and coherence. The single-tip device showed an excellent beam collimation characteristic including an order of magnitude reduction of the transverse velocity spread and an order of magnitude enhancement of beam intensity as reported with array devices previously. The evolution of the beam image with the increase of the collimation potential indicated the importance of subnanometer corrugation at the nanotip apex surface. |
| Starting Page | 167 |
| Ending Page | 168 |
| File Size | 432840 |
| Page Count | 2 |
| File Format | |
| ISBN | 9781479953066 |
| e-ISBN | 9781479953080 |
| DOI | 10.1109/IVNC.2014.6894795 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-07-06 |
| Publisher Place | Switzerland |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Logic gates Surface treatment System-on-chip Surface emitting lasers Laser stability Laser beams brightness electron beam collimation double-gated field emitter field emission |
| Content Type | Text |
| Resource Type | Article |
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