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| Content Provider | IEEE Xplore Digital Library | 
|---|---|
| Author | Tsai, C.C. Juan, C.P. Chen, K.J. Chen, K.H. Chen, L.C. Cheng, H.C. | 
| Copyright Year | 2003 | 
| Description | Author affiliation: Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan (Tsai, C.C.; Juan, C.P.; Chen, K.J.) | 
| Abstract | A lateral field emission device based on carbon nanotubes (CNTs) is proposed and the experimental results are reported. In this method, the distance between polysilicon anode and the CNTs cathode was determined by the wet etching process. Thus, the interelectrode gap is easily formed in good uniformity and reproducibility with dimensions below 1 micrometer. The CNTs were selectively grown with microwave plasma enhanced chemical vapor deposition system (MPCVD). The turn-on voltage of the fabricated device with interelectrode gap of 0.6 /spl mu/m is as low as 2 volt, and the emission current density is as high as 4 mA/cm at 20 volt. The emission current fluctuation is about /spl plusmn/15% for 2100 sec. | 
| Starting Page | 235 | 
| Ending Page | 236 | 
| File Size | 58980 | 
| Page Count | 2 | 
| File Format | |
| ISBN | 4818195154 | 
| DOI | 10.1109/IVMC.2003.1223070 | 
| Language | English | 
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) | 
| Publisher Date | 2003-07-07 | 
| Publisher Place | Japan | 
| Access Restriction | Subscribed | 
| Rights Holder | American Vacuum Society | 
| Subject Keyword | Fabrication Carbon nanotubes Anodes Cathodes Wet etching Reproducibility of results Microwave devices Plasma applications Plasma chemistry Plasma density | 
| Content Type | Text | 
| Resource Type | Article | 
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