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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Kim, J.M. Jung, J.E. Park, N.S. Ryu, Y.S. Park, Y.J. Cha, N.S. |
| Copyright Year | 1998 |
| Description | Author affiliation: Samsung Adv. Inst. of Technol., Suwon, South Korea (Kim, J.M.) |
| Abstract | The extensive electron trajectory profiling are simulated for the best confinement of electron movement. The different kinds of spacers with high aspect ratio are fabricated and compared for high vacuum packaging with the yield effects. The extensive residual gas characterizations are fully analyzed during packaging and electrical activation. Gas curing steps are fully demonstrated for stabilizing the anode and cathode. The surface condition at micro tips by oxidation effect and phosphor effect are investigated. 5" full color images are demonstrated with the above results at the anode bias of 250 volts and the gate voltage of 75 volts. |
| Starting Page | 40 |
| Ending Page | 41 |
| File Size | 425361 |
| Page Count | 2 |
| File Format | |
| ISBN | 0780350960 |
| DOI | 10.1109/IVMC.1998.728628 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1998-07-19 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Flat panel displays Electrons Packaging Anodes Curing Cathodes Oxidation Phosphors Color Voltage |
| Content Type | Text |
| Resource Type | Article |
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