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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Yater, J.E. Shaw, J.L. Jensen, K.L. Myers, R.E. Butler, J.E. Pate, B.B. Feygelson, T. |
| Copyright Year | 2010 |
| Description | Author affiliation: Beam-Wave Research, Inc., Bethesda, MD 20814, USA (Myers, R.E.) || Chemistry Division, Naval Research Laboratory, Washington, DC 20375, USA (Butler, J.E.; Pate, B.B.) || Science Applications International Corp., Washington, DC 20003, USA (Feygelson, T.) || Electronics Science and Technology Division, Naval Research Laboratory, Washington, DC 20375, USA (Yater, J.E.; Shaw, J.L.; Jensen, K.L.) |
| Abstract | Secondary-electron-emission measurements are used to examine the transport and emission characteristics of an 8.3-micron-thick diamond amplifier film. Superior transport and emission properties are confirmed for the single-crystal CVD diamond compared to previously-studied polycrystalline diamond. In particular, low-energy secondary electrons are emitted from the conduction band even after diffusing through the entire 8-micron-thick film. In the initial field-free measurements, the gain is limited by diffusive transport but it should increase greatly upon biasing the amplifier. |
| Starting Page | 211 |
| Ending Page | 212 |
| File Size | 629490 |
| Page Count | 2 |
| File Format | |
| ISBN | 9781424470983 |
| e-ISBN | 9781424470990 |
| DOI | 10.1109/IVELEC.2010.5503527 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-05-18 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electron emission Energy measurement Optical reflection Optical films Gain measurement Conductive films Cathodes Laboratories Chemistry Electron beams electron transport secondary emission diamond current amplifier negative electron affinity |
| Content Type | Text |
| Resource Type | Article |
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